1. Introduction. - 1. 1 What is Testing ?. - 1. 2 Faults and Errors. - 1. 3 Different Types of CMOS Circuits. - 1. 4 Gate-Level Model. - 1. 5 Fault Models. - References. - Problems. - 2. Test Invalidation. - 2. 1 The Test Invalidation Problem. - 2. 2 Robust Testability of Dynamic CMOS Circuits. - References. - Additional Reading. - Problems. - 3. Test Generation for Dynamic CMOS Circuits. - 3. 1 Path Sensitization and D-Algorithm. - 3. 2 Boolean Difference. - 3. 3 Fault Collapsing. - 3. 4 Redundancy in Circuits. - 3. 5 Testing of Domino CMOS Circuits. - 3. 6 Testing of CVS Circuits. - References. - Additional Reading. - Problems. - 4. Test Generation for Static CMOS Circuits. - 4. 1 Non-Robust Test Generation. - 4. 2 Robust Test Generation. - References. - Additional Reading. - Problems. - 5. Design for Robust Testability. - 5. 1 Testable Designs Using Extra Inputs. - 5. 2 Testable Designs Using Complex Gates. - 5. 3 Testable Designs Using Parity Gates. - 5. 4 Testable Designs Using Shannon's Theorem. - References. - Additional Reading. - Problems. - 6. Self-Checking Circuits. - 6. 1 Concepts and Definitions. - 6. 2 Error-Detecting Codes. - 6. 3 Self-Checking Checkers. - 6. 4 Self-Checking Functional Circuits. - References. - Additional Reading. - Problems. - 7. Conclusions. - References. Language: English