Quantitative X-Ray Diffractometry

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Quantitative X-Ray Diffractometry

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Quantitative X-Ray Diffractometry

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1.249,00 DKK

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Quantitative X-Ray Diffractometry

1 Introduction. - 1. 1 Phase analysiswhen and why. - 1. 2 Phase analysis as an analytical method. - 1. 3 History of quantitative X-ray phase analysis. - 2 Physical basis. - 2. 1 Interaction of X-rays with material. - 2. 2 Intensity in powder diffraction. - 2. 3 Backgroundangle variation and intensity. - 2. 4 X-ray diffraction by nonhomogeneous polycrystalline materials. - 2. 5 Orientation of reflecting particles. - 3 Geometric aspects of X-ray diffractometry. - 3. 1 Geometric schemes in X-ray diffractometry. - 3. 2 Diffractometers with Bragg-Brentano reflection focusing. - 3. 3 Diffractometers with Seeman-Bohlin reflection focusing. - 3. 4 Transmission technique with constant specimen-detector distance (Bragg-Brentano transmission analog). - 3. 5 Transmission technique with an invariant focusing circle (Guinier diffractometer or the Seeman-Bohlin transmission analog). - 3. 6 Debye-Sherrer geometry. - 3. 7 Powder diffractometry with synchrotron radiation. - 3. 8 Position-sensitive detectors in powder diffractometry. - 4 Methodology of quantitative phase analysis. - 4. 1 Introduction. - 4. 2 Analysis of samples with a known mass absorption coefficient (diffraction-absorption technique). - 4. 3 Internal standard method. - 4. 4 Doping method in quantitative X-ray diffractometry. - 4. 5 Dilution Method. - 4. 6 Full-phase analysis of the n-phase sample. - 4. 7 Reference intensity ratios in quantitative analysis. - 4. 8 Diffraction patterns with overlapping peaksfull diffraction pattern approach. - 4. 9 Implementation of calculated powder patterns in QXRD. - 4. 10 Standardless Methods. - 4. 11 Combination of X-ray diffraction and chemical data. - 4. 12 Crystallinity of polymers. - 4. 13 Analysis of low-mass samples. - 5 Practical aspects of quantitative phase analysis. - 5. 1 Introduction. - 5. 2 Instrumentation. - 5. 3 Specimenpreparation. - 5. 4 Analytical standards. - 5. 5 Intensity measurements. - 5. 6 Definition and subtraction of background. - 5. 7 Determination of sample absorption. - 5. 8 Pattern decomposition and simulation. - 5. 9 Methodology of corrections for preferred orientation. - 5. 10 Estimation of analysis errors. - 5. 11 Detection limit. - 5. 12 Crystallite statistics. - 6 Industrial applications. - 6. 1 Ceramics and glass ceramics. - 6. 2 Naturally occurring (geologic) samples. - 6. 3 Analysis of Portland cement. - 6. 4 Metallurgy. - 6. 5 Thin films and coatings. - 6. 6 Air pollution (aerosols and airborne dusts). - 6. 7 Pharmaceuticals. - References. Language: English
  • Brand: Unbranded
  • Kategori: Uddannelse
  • Format: Paperback
  • Forlag / Pladeselskab: Springer
  • Udgivelsesdato: 2011/12/27
  • Kunstner: Lev S. Zevin
  • Sprog: English
  • Antal sider: 372
  • Fruugo ID: 343653554-752834563
  • ISBN: 9781461395379

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